The F-60E is a fully functional environmental test chamber with a high capacity test capability.

FXBI performs cost optimization for BIST testing in HVM manufacturing High density for excellent parallelism up to 64 DUTs/ module NIST calibrates individual power supplies for each DUT.

FX5P4 is a fully functional tester for PCIe 4.0SSD drives Desktops, thermostats, and racks provide support for EVT, DVT, RDT, and HVM System based on DUT module

FX6 is a fully functional tester for PCIe 4.0SSD drives Desktops, thermostats, and racks provide support for EVT, DVT, RDT, and HVM System based on DUT module.

The FX7D-m is an engineering laboratory chassis benchtop production chassis Provides test engineers with the ability to drive standard and proprietary DUT control signals For firmware download and serial communication (i.e. SMBus, I2C, universal asynchronous transceiver, etc.)

FX7B is an ambient SSD tester (±10 ° C to 70 ° C) High density for excellent co-transmission up to 112 Para.

The FX7AE-M-250 is a fully functional tester for PCIe 5.0SSD drives Desktops, thermostats, and racks provide support for EVT, DVT, RDT, and HVM System based on DUT module.