HSBI (High Speed Memory Burn in Tester) is a 200MHz/400MBPS Memory Burn in Tester that integrates a 200MHz pattern generator, timing generator, and form factor

Fault memory and redundancy analysis processor are provided as optional.

Including test program development tools and data analysis tools

Support DDR4/5 DRAM, LPDDR, NAND flash

200MHz pattern sequencer

Full function test

220A DPS per slot

C++ based test program 

-20℃ to +150℃, flexible temperature zone adjustment, -40℃ minimum optional

2 rooms with 24 slots

Automatic interface opening