The BX series is a 50MHz or 100MHz memory burn-in tester that integrates a 200MHz pattern generator, timing generator, and formatter

Provide test program development tools and data analysis tools

Product characteristics

• Supports DRAM, NAND flash, and PRAM

• Below 50MHz

• Full function test

• 40℃ to +125℃

• Flexible for each siteBI test

• Automatic interface opening

System specification

• - Size: 3400 (W) ×1800 (D) ×2153 (H) mm

• - Weight: 3.2 tons

• - Area: 4

• - Slots per area: 8

• - Clock rate range: up to 50MHZ

• - Channel/slot: main PPS 8CH (PPS 1,2,4,5,6,7,8,9) /HV PPS 3Ch (PPS3, PPS10, PPS11)

• - Total current: 363A

• - Temperature box type: Double temperature box

• - Box power: up to 5.5 kW