• The FX7AE-M-250 is a fully functional tester for PCIe 5.0SSD drives

• Desktops, thermostats, and racks provide support for EVT, DVT, RDT, and HVM

• System based on DUT module.

• Optimizes the cost of protocol testing in HVM manufacturing, supports both side-band and OOB signals according to unique customer requirements, NIST calibrates individual power supplies for each DUT, and supports asynchronous or batch mode testing.

• Supports SATA and PCIE 1.0 to 5.0

Temperature range:

A: Environment rack with independent fan control

B: Environment +10℃ to +70℃

E: -10℃ to +85℃

ER: -40℃ to +120℃

Adaptive interface: M.2, U.2, U.3, EDSFF (E1.S, E1.L, E3)