FXBI performs cost optimization for BIST testing in HVM manufacturing

High density for excellent parallelism up to 64 DUTs/ module

NIST calibrates individual power supplies for each DUT

Supports universal asynchronous transceiver devices and OOB signals

Supports asynchronous or batch mode testing

Support M.2, U2, U.3, EDSFF and AIC shapes

DUT module based - easy to change quickly between form factors

FF and protocol-based parallelism - up to 384 SSDS per rack

Customers can choose an environmental rack or a thermal box

FXBI is designed to support smart BIST or firmware downloads and handles all power requirements for SSD testing.

FXBI is available in conjunction with Realsys-NEO's automation system to provide fully automated HVM test solutions