Gemini is an automated tester with integrated DIMM memory module testing This section describes how to test the HVM of a DDR4 or DDR5 DIMM module.

THB (or bHAST) systems are reliability test systems that apply voltage at high temperatures and humidity to enable automotive semiconductors, for example, to achieve high reliability under strict conditions.

HSBI (High Speed Memory Burn in Tester) is a 200MHz/400MBPS Memory Burn in Tester that integrates a 200MHz pattern generator, timing generator, and form factor Fault memory and redundancy analysis processor are provided as optional.

The BX series is a 50MHz or 100MHz memory burn-in tester that integrates a 200MHz pattern generator, timing generator, and formatter Provide test program development tools and data analysis tools.

FXBI performs cost optimization for BIST testing in HVM manufacturing High density for excellent parallelism up to 64 DUTs/ module NIST calibrates individual power supplies for each DUT.

FX5P4 is a fully functional tester for PCIe 4.0SSD drives Desktops, thermostats, and racks provide support for EVT, DVT, RDT, and HVM System based on DUT module

FX6 is a fully functional tester for PCIe 4.0SSD drives Desktops, thermostats, and racks provide support for EVT, DVT, RDT, and HVM System based on DUT module.

The FX7D-m is an engineering laboratory chassis benchtop production chassis Provides test engineers with the ability to drive standard and proprietary DUT control signals For firmware download and serial communication (i.e. SMBus, I2C, universal asynchronous transceiver, etc.)

FX7B is an ambient SSD tester (±10 ° C to 70 ° C) High density for excellent co-transmission up to 112 Para.

The FX7AE-M-250 is a fully functional tester for PCIe 5.0SSD drives Desktops, thermostats, and racks provide support for EVT, DVT, RDT, and HVM System based on DUT module.