Universal monitoring burn-in tester for DRAM and flash packages.

THB (or bHAST) systems are reliability test systems that apply voltage at high temperatures and humidity to enable automotive semiconductors, for example, to achieve high reliability under strict conditions.

HSBI (High Speed Memory Burn in Tester) is a 200MHz/400MBPS Memory Burn in Tester that integrates a 200MHz pattern generator, timing generator, and form factor Fault memory and redundancy analysis processor are provided as optional.

The BX series is a 50MHz or 100MHz memory burn-in tester that integrates a 200MHz pattern generator, timing generator, and formatter Provide test program development tools and data analysis tools.